Capabilities and Expertise

Chemical analysis
  • Analysis of chemical composition (from main constituents down to ultra traces) of solid materials (bulk and thin layers), solutions, bio-materials and gases.
  • Optical and physical properties of glasses.
  • Characterization of powders. Process analytics, including data analysis and chemometrics.
Molecular and structural analysis
  • Characterization of materials with respect to structure, composition, and orientation
  • Time-resolved and in-line analysis of (bio-)chemical reactions
  • Characterization in complex (biomedical) matrices as well as in devices
  • Identification and molecular weight (distribution) of organic materials
  • Phase, texture and stress analysis in inorganic and thin-film materials
  • Thermal analysis
  • Competitor screening
  • Experimental design and chemometrics
Surface and thin film analysis
  • Analysis of the chemical composition and morphology of surfaces and thin films.
  • Depth profiling of main constituents and dopants or contaminations.
  • Determination of dopant profiles in silicon wafers and contaminants on the surface.
  • Micro- and nanostructural analysis of semiconductor devices, thin film and bulk materials.

Techniques used

Chemical analysis
Atomic Spectrometry (AAS, ICP-AES, ICP-MS, (LA)-ICP-MS), Ion-chromatography, Gas analysis, Electrochemical analysis, Coulometry, Powder characterization, Particle size distribution, Physical properties of glass, Gravimetry, Titrimetry, Ellipsometry, XRF, NTM, Thermal Analysis.

Molecular and structural analysis
Chromatography (GC, HPLC, GPC, IC), Optical Spectroscopy (NIR, Fluorescence, (UV-VIS, FT-IR, Raman), Mass spectroscopy (TOF-MS, ion trap MS), MS, GC-MS-FTIR), AFM.SPM, XRD, Thermal analysis (TGA, DSC) and Rheometry

Surface and thin film analysis
SSIMS, DSIMS, XPS/ESCA, SAM/AES, SEM/EPMA, RBS/ERD/Channelling, (cryo)-TEM, FIB, Optical Profilometry.