Real analysis in a virtual lab
Remote materials analysis - by internet
Imagine being able to follow what a specialist is seeing with a microscope on the other side of the world;
performing analysis on your sample. This interactive way of research is now possible using the Virtual Lab. It allows
you to directly discuss new data via the internet and interactively convene to reach a conclusion on your analytical
questions. MiPlaza Materials Analysis offers such a worldwide virtual laboratory for materials characterization.
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Chemically modified antibodies
Characterised using liquid chromatography-mass spectrometry
The recognition of specific proteins by antibodies is increasingly used to visualise certain proteins in the human body or to design specific detection assays. This requires tailoring of the antibody, for example via chemical modification of certain reactive groups present on the protein. The reaction efficiency of such chemical modifications has been monitored using liquid chromatography-mass spectrometry (LC-MS).
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Materials for optical pickup lenses
Photo-rheology of a polymerization process
Photo polymerization has found many applications in the manufacturing of precisely structured components such as optical discs, gratings, lenses, and printed circuit boards. Among these, one of the most demanding applications is the manufacturing of aspherical lenses such as used for the read-out or writing of optical discs. Photo-rheology is an analytical tool used to optimize the polymerization process of the lens coating.
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From CD to Blu-ray
Imaging data storage on the nanometer-scale
Optical recording for data storage has a long history and as we approach 100 Gbytes on a CD-sized
disk, the shape and stability of data marks becomes more and more difficult to determine. New
techniques based on atomic force microscopy offer a solution for analysis of data marks as narrow as
100 nanometers, even if these marks are not visible as a height difference in the material.
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In-situ analysis of a polymerization process
An FT-IR study in transflective displays
Transflective LCD’s are generally preferred for mobile applications since the combination of backlighting and reflection of
ambient light provides excellent visibility under virtually all lighting conditions. To make such devices, a special so-called
retarder layer is essential. In a new process this retarder layer is structured on a sub-pixel scale by polymerisation.To optimize its
performance it is essential to completely understand the individual processes that are involved in the production process.
This note describes how Fourier Transform Infrared (FT-IR) spectroscopy makes it possible to analyse this process in-situ. Download here....
A NMR study
Chemical composition and diffusion properties of complex mixtures
Molecular characterization and quantification of mixture components are essential analyses in chemical research and production environments.
Similarly, absolute determination of diffusion constants of mixture components is often needed to solve problems of a more
physical nature. Both can be assessed most adequately with NMR (Nuclear Magnetic Resonance) spectroscopy. This is exemplified for
a mixture of liquid crystal (LC) material and UV-curable polymer precursors as used for the production of new-generation LC displays.
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UV curing of optical pick-up lenses
A closer look with Raman spectroscopy
Optical pick-up lenses are used in optical storage devices such as CD, DVD and DVR. To obtain the highest information density
possible, these lenses need to focus a laser-beam perfectly. The production of such lenses is based on UV-induced polymerization of
lacquer on the glass lens. During this process the lacquer is completely surrounded by glass, which makes it difficult to study the
polymerization reaction.
This note describes the use of Raman spectroscopy for optimizing and characterizing the lacquer polymerization in a set-up that mimics
the actual production. As the reaction is followed from a distance through a glass window, the example shows the strength of
Raman spectroscopy as an on-line analysis tool.
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Valence Analyses of Elements UV absorbing dopes in quartz
In modern Xenon light bulbs for automotive applications, elements like Cerium (Ce) and Europium (Eu) are used in the quartz sleeve to intercept harmful UV radiation. For optimal performance the Ce has to be in the trivalent state and Eu in the divalent state. By applying both Ce and Eu, UV radiation between 180 and 400 nm is effectively absorbed. For optimal performance Ce(III) is added as Ce-Si-oxide and Eu(II) is added as Eu-Al-oxide. To ensure these lower valences, the oxides are prepared under reducing atmosphere. Chemical analysis is used to determine the efficiency of this reduction process. Download here....
Thermal expansion of thin dielectric layers Using Spectroscopic Ellipsometry
State-of the-art integrated circuits require a low dielectric constant (low-k) material. Porosity of these new materials further reduces the k value. Since interesting porous materials are combinations of organic and inorganic components, expansion can be very different. Temperature dependent ellipsometry offers the possibility to measure thermal expansion of thin layers. In addition, it provides information about water absorption behaviour of these samples. This enables a faster route for device optimisation, since these properties are vital to reliability of devices.
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Air pollution in cleanrooms
A closer look with Ion Chromatography
In cleanrooms various processes take place, such as lithography, baking and etching. These activities, but also
outside air, can be the source of many gaseous contaminants. These form a potential health risk for people working
in the cleanroom. By maintaining normal precautions in the cleanroom, health risks can be avoided effectively as
concentrations of contaminants remain far below the MAC values. However, the contaminant level is not zero and the
low concentrations present can still damage equipment and influence processes in the cleanroom.This application note
describes the analytical method used for the detection of reactive contaminants, like ammonia and acid vapours. Download here....
ICP-AES: quantitative analyses,
from sub-atomic layer to bulk composition
Small variations in the elemental composition of a material can have a major effect on its characteristics. Deviations
from normal values are often the source of problems in a production environment.Therefore, quantitative elemental
analysis is essential for both problem solving and quality control. For quantitative analysis the bulk of a sample
has to be analyzed.Wet-chemical procedures that dissolve the material in strong acids (HCl, HNO3, HClO4) have to
be used.To analyze such solutions, often with high salt concentrations, a very robust analytical technique like ICPAES
is required. Download here....
Analysis of airborne particles and
deposits in production processes
Elemental analysis can help to identify the source of contamination in cleanrooms. Often the contamination consists of airborne
particles or deposits in production equipment.This makes sampling a challenge when the production processes cannot be disturbed.
After sampling, several analytical techniques can be used for characterization of the material found.The most common approach is
acid digestion, followed by quantitative analysis using Inductively Coupled Plasma-Mass Spectrometry (ICP-MS). Laser Ablation (LA)
however forms a good alternative for wet-chemical analysis of solids as it solves many of the problems associated with the
conventional acid-digestion method. Download here....
Process Analytics
Process Analytics is the application of analytical science to the monitoring and control of industrial processes. The goal is always to
both control and optimize the performance of processes or products. Key factors are productivity, quality, cost, and reduction of
emissions to the environment. Depending on the type of problem, a distinction is made between off-line, at-line and in-line analyses. Download here....
Phase-change Recording
process optimization using X-rays
Phase-change optical recording is a challenging technology for data storage that is used in CD and
DVD rewritables. It is based on localized laser induced heating of a thin layer, which causes a phase
transition from crystalline to amorphous. This transformation results in optical reflectance
differences. The composition and thickness of the various layers in these rewritable discs are very
important parameters, which have to be optimized. Download here....
Self-assembled monolayers a closer look with X-ray Photoelectron Spectroscopy
A Self Assembled Monolayers (SAMs) are used in the area of molecular recognition,
surface engineering, micro-contact printing and molecular electronics. A crucial
aspect in the fabrication of molecular electronics is the formation of a high
quality self-assembled monolayer. Characterization of different SAMs on gold has
been investigated in detail using X-ray Photoelectron Spectroscopy (XPS). Download here....
Polymer Solar Cell characterization Time-of Flight Secondary Ion Mass Spectrometry
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is applied for the study of polymer large-area solar cells. With this method a compositional cross-section can be made of layered structures with very high sensitivity. It is shown that TOF-SIMS is an effective depth profiling method for screening the layered structure and interfaces for contaminants that might effect the functioning of devices such as solar cells. Download here....
Uniformity of phase-change layers
An Electron Probe MicroAnalysis study
Electron Probe MicroAnalysis (EPMA) is a very suitable technique for determining the thickness and composition of thin layers
such as the phase-change layer used in optical rewritable discs.This layer, deposited by sputtering, must be uniform in thickness
and composition to achieve good performance in rewritability. EPMA has been used for optimizing a new sputter module.
Variations in thickness and composition of the layer can be detected quantitatively with a good lateral resolution and a high
precision and accuracy. Download here....
Tuning of the nanowire
growth process A TEM/FIB analysis on nanometer scale
Semi-conducting nanowires could be applied in many fields like in opto-electronics (lasers), semiconductor
industry (transistors) or as electron sources (SEM,TEM). In their way to a valuable application,
the nanowire production process has to be optimized.TEM in combination with FIB preparation is a
useful analytical technique for this purpose. Download here....
Polymer LEDs
analytical problem-solving for better performance
In research and development, insight into the composition and structure of new materials and devices is essential. Materials Analysis
offers a full range of methods and expertise not only to provide the required analytical information, but also to act as a partner in problem
solving. The support of Materials Analysis during the development of polyLEDs is a good example of how analytical information
leads to a better product. Download here....
Spin-tunneling sensor in magnetic read heads
A closer look with RBS
Sensors in the latest read heads for hard disks use the GMR-effect (Giant Magneto Resistance) to read out stored data.
The GMR-effect is based on a 5 to 10% change of the sensor resistance when a bit passes the magnetic read head. To read
out sub-micron bits in the future, a more sensitive sensor is needed. Recently, a new promising sensor has been discovered:
the spin-tunneling sensor. In this sensor a 25 to 30% change of sensor resistance can be achieved. This application note
shows the power of Rutherford Backscattering Spectrometry (RBS) as a tool for studies of nanometer-thick multi-layers,
as used in the new type of sensor. Download here....
Etching artefacts
a closer look with Scanning Auger Microscopy
Scanning Auger Microscopy (SAM or Auger Electron Spectroscopy, AES) is an analytical technique that is
used to determine the elemental composition of the top few nanometers of a surface or an exposed
interface in a solid material. SAM offers the possibility of combining scanning electron microscopy (SEM)
images with elemental analysis in order to give a lateral elemental distribution with very high spatial resolution
(50 nm). Furthermore, compositional depth profiles can be obtained by combining SAM with ion
beam sputter etching. This application note deals with a study of the undercutting phenomenon of
isotropic etching using several capabilities of SAM. Download here....
Process control of large displays
A SEM/FIB analysis on active matrix polymer LEDs
Small displays based on light emitting polymers made their introduction on the commercial market in mobile phones and shavers
a few years ago. However, to make the step towards large displays based on this technology, the demands on resolution and uniformity
become more important. Active Matrix Polymer LED (AMPLED) technology, using thin film transistors (TFTs), enables the manufacturing
of large displays. Scanning Electron Microscope (SEM) and Focused Ion Beam (FIB) analysis can be used to check and visualise
the obtained structures enabling further improvement of new and existing manufacturing processes. Download here....
Microstructure vs electrical properties
In-situ resistance measurements as a function of temperature in the TEM
Insight into the influence of the microstructure on the electrical properties is of utmost importance for the development of various
materials. In many cases, transmission electron miscroscopy (TEM) is very useful as it has an extremely high resolution.TEM studies
can include in-situ annealing experiments of the material of interest to monitor changes as a function of temperature. In collaboration
between Philips CFT and Research, a dedicated specimen holder was developed that enables measurement of the electrical resistance
of a sample in the TEM during annealing. In this way, a direct correlation between changes in microstructure and changes in the
electrical properties can be obtained. Download here....
Coatings
a closer look with XPS
X-ray Photoelectron Spectroscopy (XPS) is a powerful technique that can help in the identification of the chemical structure of coatings,
produced by Philips or others. Coatings are used in every day life on the outside of TV screens to reduce reflection and on the
inside and outside of lamp bulbs (to increase lifetime and efficiency, respectively).
This application note deals with an example of XPS measurements performed on a thin (2 to 5 nm) coating on the outside of
a competitor’s TV-screen. Download here....
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