Solid Phase Epitaxy versus random nucleation and growth in sub-20 nm wide FinFETs
R. Duffy, M.J.H. van Dal, B.J. Pawlak, M. Kaiser, R.G.R. Weemaes
Applied Physics Letters 90, 241912 (2007)

  Lanthanide Complexes of Novel Acetamido-Substituted Triethylenetetramine Ligands as Novel ParaCEST MRI Contrast Agents
D. Burdinski, J. Lub, J. A. Pikkemaat, H. Grüll, L. Nieto Garrido, S. G. Girard, D. Moreno Jalón, T. Weyhermüller.
Biol. Inorg. Chem. 2007, 17, S17.

Dendritic PARACEST contrast agents for magnetic resonance imaging
Pikkemaat JA, Wegh RT, Lamerichs R, van de Molengraaf RA, Langereis S, Burdinski D, Raymond AY, Janssen HM, de Waal BF, Willard NP, Meijer EW, Grüll H.
Contrast Media Mol. Imaging 2:229-239 (2007) 

Gatestacks for scalable high-performance FinFETs
G. Vellianitis, M.J.H. van Dal, L. Witters, G. Curatola, G. Doornbos, N. Collaert, C. Jonville, C. Torregiani, L.-S. Lai, J. Petry, B.J. Pawlak, R. Duffy, M. Demand, S. Beckx, S. Mertens, A. Delabie, T. Vandeweyer, C. Delvayx, F. Leys, A. Hikavyy, R. Rooyakkers, M. Kaiser, R.G.R. Weemaes, F. Voogt, H. Roberts, D. Donnet, S. Biesemans, M. Juczak, R.J.P. Lander 
EDM 2007, p. 681-684 (2007)

440 nF/mm2 world record capacitance density for multiple ALD-grown MIM capacitor stacks in 3D silicon
J.H. Klootwijk, K.B. Jinesh, W. Dekkers, J.F. Verhoeven, F.C. van den Heuvel, H.-D. Kim, D. Blin, M.A. Verheijen, R.G.R. Weemaes, M. Kaiser, J.J.M. Ruigrok and F. Roozeboom
IEEE Electron Device Letters 0741/3106 (2007)

Detection of recording marks on digital versatile discs and Blu-Ray discs using conductive AFM
A.J.G. Mank, A.E. T. , H.A.G. Nulens, B. Feddes and G. Wei,
Jap. J. Appl. Phys. 46(9A) (2007) 5813-5820

Analysis of the Degradation Mechanism during Repeated Overwrite of Phase-Change Discs
A.E. Ton Kuiper, Donato Pasquariello, Corrie W.T. Bulle-Lieuwma, Monja Kaiser, Marcel A. Verheijen, Harry A.G. Nulens, Liesbeth van Pieterson, and George J. Y. Zhong. 
Jpn. J. Appl. Phys., Vol. 46, No. 3A, 2007, pp. 1037-1041 : (D09,H02)

  Characterization of Laminated CeO2–HfO2 High-k Gate Dielectrics Grown by Pulsed Laser Deposition 
K. Karakaya, A. Zinine, J. G. M. van Berkum, M. A. Verheijen, Z. M. Rittersma, G. Rijnders, and D. H. A. Blank 
J. Electrochem. Soc. 153, F233 (2006) 

Mg-Ti based materials for electrochemical hydrogen storage
W.P. Kalisvaart, H.J. Wondergem, F. Bakker, P.H.L. Notten
Journal of Materials Research (J. Mater. Res. (2007). 22(6), 1640-1649

Quantification of Liquid Crystal Concentrations in holographic Polymer dispersed Liquid Crystal Reflection Gratings by Dymanic Secondary ion Mass spectrometry and Multivariate Statistical Analysis
B.K.C. Kjellander, C.W.T. Bulle-Lieuwma, L.J. van Ijzendoorn, A.M. de Jong, D.J. Broer, J.W. Niemantsverdriet 
Journal of Physical Chemistry C, 111 (29), 10965-10971 (2007)

Epitaxial growth of III-V nanowires on Silicon
E.P.A.M. Bakkers, L.M.T. Borgstrom, M.A. Verheijen
MRS Bulletin 32 (2007) 117

Morphology of GaP-GaAs nanowires revealed by 3D TEM tomography 
M.A. Verheijen, R.E. Algra, M.T. Borgström, G. Immink, E. Sourty, W.J.P. van Enckevort, E. Vlieg, E.P.A.M. Bakkers
Nano Lett., 7 (2007) 3051-3055

Remote p-Doping of InAs Nanowires
H.-Y. Li, O. Wunnicke, M. T. Borgström, W. G. G. Immink, M. H. M. van Weert, M. A. Verheijen, and E. P. A. M. Bakkers
Nano Lett.; 2007; 7(5) pp 1144 - 1148

Single quantum dot nanowire LEDs
Ethan D. Minot, Freek Kelkensberg, Maarten van Kouwen, Jorden A. van Dam, Leo P. Kouwenhoven, Valery Zwiller, Magnus T. Borgström, Olaf Wunnicke, M. A. Verheijen and Erik P. A. M. Bakkers
Nano Lett., 7 (2007) 367 - 371

Unified description of potential profiles and electrical transport in unipolar and ambipolar organic field-effect transistors
Edsger C.P. Smits, S.G.J. Mathijssen , M. Cölle, A.J.G. Mank, P.A. Bobbert, P.W.M. Blom, B. de Boer, D. M. de Leeuw
Phys. Rev B 76, 125202 (2007)

Towards ParaCEST MRI Contrast Agents Without Coordinated Water: Lanthanide Complexes of Novel Acetamido-Substituted Diethylenetriamine- and Triethylenetetramine Ligands.
D. Burdinski, J. Lub, J. A. Pikkemaat, R. T. Wegh, H. Grüll, L. Nieto Garrido, S. G. Girard, S. Martial, C. Del Pozo Ochoa, D. Moreno Jalón, and T. Weyhermüller
Proc. Intl. Soc. Magn. Reson. Med. 2007, 15, 1182.

Highly manufacturable FinFETs with sub-10nm fin width and high aspect ratio fabricated with immersion lithography 
M.J.H. van Dal, N. Collaert, G. Doornbos, G. Vellianitis, G. Curatola, B.J. Pawlak, R. Duffy, C. Jonville, B. Degroote, E. Altamirano, E. Kunnen, M. Demand, S. Beckx, T. Vandeweyer, C. Delvaux, F. Leys, A. Hikavya, R. Rooyackers, M. Kaiser, R.G.R. Weemaes, S. Biesemans, M. Jurczak, K. Anil, L. Witters, R.J.P. Lander.
Symp. VLSI Tech. Dig., 110 (2007)

Wide range three-dimensional reciprocal space mapping: a novel approach applied to organic monodomain thin films.
R. Resel, O. Lengyel, T. Haber, O. Werzer, W. Hardeman, D. M. de Leeuw and H.J. Wondergem
Journal of Applied Crystallography (J. Appl. Cryst. (2007). 40, 580-582)

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Solution-Processed Thin Films of Thiophene Mesogens with Single-Crystalline Alignment
Ondrej Lengyel; Willie M. Hardeman; Harry J. Wondergem; Dago M. de Leeuw;Albert J. J. M. van Breemen and Roland Resel
Advanced Materials; 2006; 18; 896–899

Strong overtones and combination bands in ultraviolet resonance Raman spectroscopy
E.Efremov; F. Ariese; A.J.G. Mank and C. Gooijer
Anal. Chem. 78; 2006; 3152-3157

Low cost spectroscopy with a variable multivariate optical element
Uzunbajakava, N.; Peinder, P. de; Hooft, G.W. 't; Gogh, A.T.M. van
Anal. Chem., 78 ( 20 ), 7302 - 7308 , 2006.

Low volume sampling device for mass spectrometry analysis of gas formation in nickel-metalhydride (NiMH) batteries
P.V.E. Krusemann; A.J.G. Mank; A. Belfadhel-Ayeb and P.H.L.Notten
Anal. Chim. Acta 566; 2006; 238-245

Archival-overwrite performance of GeSnSb-based phase-change discs
Pieterson; L. van; Rijpers; J.C.N.; Verheijen; M.A.; Elfrink; R.J.G.; Hesselink; E. ; Kaiser; M.
Appl. Phys. Lett.; Vol. 99; 066111-1/3; 2006

3D TOFSIMS Characterization of Black Spots in Polymer Light Emitting Diodes
C.W.T. Bulle-Lieuwma and P. van de Weijer,
Appl. Surf. Science 252, issue 19, 2006, pg 6597-6600

Preparation of monodisperse polymer particles and capsules by ink-jet printing 
Böhmer, Marcel R., Schroeders, Richard, Steenbakkers, Jan A.M., de Winter, Suzanne H.P.M., Duineveld, Paul A., Lub, Johan, Nijssen, Wim P.M., Pikkemaat, Jeroen A., Stapert, Henk R. 
Colloids and Surfaces a Physicochemical And Engineering Aspects Vol. 289:96-105 (2006).

  Growth Kinetics of Heterostructured GaP-GaAs Nanowires
Marcel A. Verheijen, George Immink, Thierry de Smet, Magnus T. Borgström, Erik P.A.M. Bakkers
J. Am. Chem. Soc., 128 (2006) 1353-1359.

In-situ curing analysis of photo-replicated objective lenses using Raman and IR-spectroscopy
A.J.G. Mank; E. Verstegen and H. Kloosterboer
J. Appl. Polymer Sci.; 99; 2006; 1287-1295

Ink dependence of poly (dimethylsiloxane) contamination in microcontact printing
R. Sharpe; D. Burdinski; C. van der Marel; J. Jansen and C. Poelsma
Langmuir; 22; 2006; 5945-5951

Positive microcontact printing with mercaptoalkylogligo (enthylene glycols)
M. Saalmink; C. van der Marel; H. Stapert and D. Burdinski
Langmuir; 22; 2006; 1016-1026

In situ transmission electron microscopy investigation of the structural changes in carbon naotubes during lectron emission at high currents
M. Doytcheva; M. Kaiser; N. de Jonge
Nanotechnology 17; 2006; 3226-3233

Interface Study on Heterostructured GaP-GaAs Nanowires
Borgstrom, L.M.T. ;Verheijen, M.A.;Immink, W.G.G.;Smet, T.M.F. de;Bakkers, E.P.A.M.
Nanotechnology 17 (2006) 4010-4013 

Position-controlled epitaxial III–V nanowires on silicon
Aarnoud L Roest; Marcel A Verheijen; Olaf Wunnicke; Stacey Serafin; Harry Wondergem and Erik P A M Bakkers
Nanotechnology; 17; 2006 S271–S275

Groeikinetiek van halfgeleidende nanodraden
Marcel A. Verheijen; George Immink; Thierry de Smet; Magnus T. Borgstrom; Erik P.A.M. Bakkers
NEVAC Blad, 44e jaargang, 2006, nr. 2, pag. 49-52

  In-situ transmission electron microscopy of individual free-standing multi-walled carbon nanotubes 
Monja Kaiser, Maya Doytcheva, Marcel Verheijen, Niels de Jonge
Ultramiscroscopy (2006) 106, 902-908

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Multilayer approach to the quantitative analysis of x-ray photoelectron spectroscopy results: Applications to ultrathin SiO2 on Si and to self-assembled monolayers on gold
C. van der Marel, M. Yildirim, and H. R. Stapert
J. Vac. Sc.Techn. A23 (2005) 1456  

Plasma nitrided silicon rich oxide as an extension to ultra-thin nitrided oxide gate dielectrics
F. N. Cubaynes and V. C. Venezia , C. van der Marel and J. H. M. Snijders
Appl. Phys. Lett. 86 (2005) 

Spatially resolved Raman and UV-visible-NIR spectroscopy on the preparation of supported catalyst bodies: controlling the formation of H2PMo11CoO40 5- inside Al2O3 pellets during impregnation
Bergwerff JA, van de Water LG, Visser T, de Peinder P, Leliveld BR, de Jong KP, Weckhuysen BM
Chemistry. 2005 ;11(16):4591-601  

Identification of a urinary metabolite profile associated with osteoarthritis
Lamers, R.J., van Nesselrooij, J.H.J., Kraus, V.B., J.M., Renner, J.B., Dragomir, A.D., Luta, G., van der Greef, J., DeGroot, J.
Osteoarthritis Cartilage 13, 762-768 (2005)

Cap closing of thin carbon nanotubes
N. de Jonge, M. Doytcheva, M. Allioux, M. Kaiser, S.A.M. Mentink, K.B.K. Teo, R.G. Lacerda, W.I. Milne Adv. Mater. 17 (4), (2005) 

ANOVA-simultaneous component analysis (ASCA): a new tool for analyzing designed 
Smilde, A.K., Jansen, J.J., Hoefsloot, H.C., Lamers, R.J., van der Greef, J., Timmerman, M.E Bioinformatics 21, 3043-3048 (2005)  

Profiles of metabolites and gene expression in rats with chemically induced hepatic necrosis
Heijne, W.H., Lamers, R.J., van Bladeren, P.J., Groten, J.P., van Nesselrooij, J.H.J., van
Pathol 33, 425-433 (2005)

Diagnostic analysis of experimental artefacts in DOSY NMR data by covariance matrix of the residuals
Huo, R., van de Molengraaf, R.A., Pikkemaat, J.A., Wehrens, R., Buydens, L.M.C. J. Magn. Resonance 172:346-358 (2005)

Silicides for advanced CMOS devices A. Lauwers, J.A. Kittl, M.J.H. van Dal, O. Chamiran, M.A. Pawlak, C. Torregiani, A. Benedetti, O.Richard, H. Bender, J.G.M. van Berkum, M. Kaiser, A. Veloso, K.G. Anil, M. de Potter, K.
Proceedings MSM XIV; Microscopy of Semiconducting Materials (2005, Oxford , UK )

Cross-sectional studies of epitaxial growth of InP and GaP nanowires on Si and Ge
M.A. Verheijen, E.P.A.M. Bakkers, A.R. Balkenende, A.L. Roest, M.M.H. Wagemans, M. Kaiser, H.J. Wondergem, and P.C.J. Graat
Proceedings 14th Conference Microscopy of Semiconducting Materials 2005, Oxford, U.K, Springer-Verlag Berlin Heidelberg, 2005, p. 295-298.

Low-temperature diffusion of high-concentration phosphorus in silicon, a preferential movement towards the surface
R. Duffy, V. C. Venezia, J. Loo, M. J. P. Hopstaken, M. A. Verheijen, J. G. M. van Berkum, G. C. J. Maas, Y. Tamminga, T. Dao, C. Demeurisse
Applied Phys. Lett, 86 (2005) 081917-1 to 081917-3 .

In situ Raman analysis of gas formation in NiMH batteries
A.J.G. Mank, A. Belfadhel-Ayeb, P.V.E. Krüsemann and P.H.L. Notten
Appl. Spectroscopy 59 (1) (2005)

Profiling of LC displays with Raman spectroscopy - preprocessing of spectra 
M. Stanimirovic, H.F.M. Boelens, A.J.G. Mank, H.C.J. Hoefsloot and A.K. Smilde
Appl. Spectroscopy 59 (3) (2005)  

Raman characterization of photo-stratification in paintable displays 
A.J.G. Mank, I. Vorstenbosch, R. Penterman, S. Klink, J. Vogels and D. Broer
Appl. Spectroscopy 59 (8) (2005) 

Low-temperature diffusion of high-concentration phosphorus in silicon, a preferential movement towards the surface
R. Duffy, V. C. Venezia, J. Loo, M. J. P. Hopstaken, M. A. Verheijen, J. G. M. van Berkum, G. C. J. Maas, Y. Tamminga, T. Dao, C. Demeurisse
Applied Phys. Lett. 86 (2005) 081917-1 

  High anisotropy of the field-effect transistor mobility in magnetically aligned discotic liquid-crystalline semiconductors
H.J. Wondergem
Journal of the American Chemical Society 127 (46): 16233-16237 (2005) 

Organic thin-film electronics from vitreous solution-processed rubrene hypereutectics
H.J. Wondergem
Nature Materials 4 (8):  601-606 2005 

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Boron diffusion in amorphous silicon preamorphized by germanium implantation and the role of fluorine
R.D. Duffy, V.C. Venezia, A. Heringa, B.J. Pawlak, M.J.P. Hopstaken, G.C.J. Maas, Y. Tamminga, T. Dao, F. Roozeboom, L. Pelaz
Applied Physics Letters. 84, 21 (2004) 4283

Characterization of the field emission properties of individual thin carbon nano tubes
N. de Jonge, M. Allioux, M. Doytcheva, M. Kaiser
Applied Physics Letters, Volume 85, no 9 (2004) 

Effects of Crystalline regrowth on dopant profiles in pre-amorphized silicon
M.J.P. Hopstaken, Y. Tamminga, M.A. Verheijen, R.D. Duffy, V.C. Venezia, A. Heringa
Applied Surface Science, 231-232 (2004) 688

Quantification issues of trace metal contaminants on silicon wafers by means of TOF-SIMS, ICP-MS and TXRF
P. Rostam-Khani, M.J.P. Hopstaken, P. Vullings, G. Noij, O. O'Halloran, W. Claassen
Applied Surface Science, 231-232 (2004) 720

Electron emission from individual nitrogen-doped multi-walled carbon nanotubes
Maya Doytcheva, Monja Kaiser, Marcel A. Verheijen, Marisol Reyes-Reyes, Mauricio Terrones and Niels de Jonge
Chem. Physics Letters, Volume 396(2004) 

TEM study of InSbTe crystal morphology as a function of crystallization conditions
Marcel A. Verheijen, Andrei Mijritskii, Bart Kooi
Conference proceedings, MRS 2003 Fall Meeting, Boston, USA, Volume 803 (2004) 

Advanced PMOS device integration scheme for highly-doped ultra-shallow junctions
R.C. Surdeanu, B.J. Pawlak, R. Lindsay, M.J.H. van Dal, G. Doornbos, C. Dachs, Y.V. Ponomarev, J.J.G.P. Loo, F.N. Cubaynes, K. Henson, M.A. Verheijen, M. Kaiser, X. Pages, P.A. Stolk, B. Taylor, M. Jurczak
Jpn J. Appl. Phys. Journal IPAP (Institute of Pure and Applied Physics), Volume 43 (4B) 2004

Island growth in the atomic layer deposition of zirconium oxide and aluminum oxide on hydrogen-terminated silicon: growth modeling and transmission electron microscopy
R.L. Puurunen, W. Besling, O. Richard, H. Bender, M.M. Viitanen, M. de Ridder, H.H. Brongersma, T. Conard, C. Zhao, Y. Tamminga, T. Dao, T. de Win, M.A. Verheijen, M. Kaiser, M. Tuominen, A. Delabie, M. Caymax, S. De Gendt, M. Heyns, W. Vandervorst
Journal of Applied Physics, Volume 96 (2004) 4878-4889

In-situ transmission electron microscopy analysis of electron beam induced crystallization of amorphous marks in phase-change materials
M. Kaiser, L. van Pieterson, M.A. Verheijen
Journal of Applied Physics, Volume 96, 6 (2004) 3193-3198.

The relation between phase transformation and onset of thermal degradation in nanoscale  CoSi2-polycrystalline silicon structures
M.J.H. van Dal, D. Jawarani, J.G.M. van Berkum, M. Kaiser, J.A. Kittl, C. Vrancken, M. de Potter, A. Lauwers and K. Maex
Journal of Applied Physics, Volume 96, 12 (2004)

Characterization of Thermal and Electrical Stability of MOCVD HfO2-HfSiO4 Dielectric Layers with Polysilicon Electrodes for Advanced CMOS Technologies
Z.M. Rittersma, J.J.G.P. Loo and Y.V. Ponomarev, M.A. Verheijen and M. Kaiser, F. Roozeboom, S. van Elshocht and M. Caymax
J. Electrochem. Soc., Volume 151(2004) 

HfSi04 dielectric layers deposited by atomic layer deposition using HfC14 and NH2(CH2)3Si(OC2H5)3 precursors
Z.M. Rittersma, F. Roozeboom, M.A. Verheijen, J.G.M. van Berkum, T. Dao, J.H.M. Snijders, E. Vainonen-Ahlgren, E. Tois, M. Tuominen, S. Haukka
J. Electrochem, Soc., Volume 151 (2004)

Pt-Co/SiO2 Bimetallic Planar Model Catalysts for Selective Hydrogenation of Crotonaldehyde
A. Borgna, B.G. Anderson, A.M. Saib, H. Bluhm, M. Havecker, A. Knop-Gericke, A.E.T. Kuiper, Y. Tamminga and J.W. Niemantsverdriet
J. Phys. Chem B, 108 (2004)

Influence of preamorphization and recrystallization on indium doping profiles in silicon
R.D. Duffy, V.C. Venezia, A. Heringa, B.J. Pawlak, M.J.P. Hopstaken, Y. Tamminga, T. Dao, F. Roozeboom, C.C. Wang, C.H. Diaz, P.B. Griffin
J. Vac. Sci. Technol., B 22 (3), 865-868 (2004)

Thickness and composition of ultrathin SiO2 layers on Si
C. van der Marel, M.A. Verheijen, Y. Tamminga, R.H.W. Pijnenburg, N. Tombros and F. Cubaynes
J. Vac. Sci. Technol., A22 (2004)  1572-1578.

Assessing the performance of two dimensional dopant profiling techniques 
N. Duhayon, P.Eyben, M. Fouchier, T. Clarysse, W. Vandervorst, D.Alvarez, S. Schoemann, M.Ciappa, M. Stangoni, P. Formanek, V. Raineri, F. Giannazzo, D. Goghero, Y. Rosenwaks, R. Shikler, S. Sadewasser, N. Barreau, M. Verheijen, S. Mentink, R. Wiesendanger, M. Von Sprekselen, T. Maltezopoulos, L. Hellemans
J. Vac. Sci. Technol. B 22, 385 (2004)

XRD Analysis of hightly oriented Pb(Mg,Nb)O3-PbTiO3 perovskite layers
P. Graat, S. Prinz, H.J. Wondergem, M. Klee and J. Meyer
Materials Structure, volume 11, 1a (2004)

Metabolic profile of the hippocampus of Zucker Diabetic Fatty rats assessed by in vivo (1)H magnetic resonance spectroscopy
M. van der Graaf, S.W. Janssen, J.J. van Asten, A.R. Hermus, C.G. Fred Sweep, J.A. Pikkemaat, G.C. Martens, A. Heerschap
NMR Biomed, Volume 17:405-10 (2004)

Modification of PEDOT:PSS as hole injection layer in polymerLEDs
M.M. de Kok, M. Buechel, S.I.E. Vulto, P. van de Weijer, E.A. Meulenkamp, S.H.P.M. de Winter, A.J.G. Mank, H.J.M. Vorstenbosch, C.H.L. Weijtens, V. van Elsbergen
Physica Status Solidi - A - Applied Research, Volume 201 (6) (2004)

High-resolution transmission electron microscopy of individual mulit-walled carbon nano tubes mounted on a tungsten support tip
M. Kaiser, N. de Jonge, M. Doytcheva, M. Allioux
Proceedings EMC, Volume II, 227-228 (2004)

Critical Review of the current status of thickness measurements for ultrathin SiO2 on Si part V: Results of a CCQM pilot study
M.P. Seah, …, C. van der Marel, M. Verheijen and Y. Tamminga
SIA, Volume 36 (2004) 

Demineralized bone matrix-induced ectopic bone formation in rats: in vivo study with follow-up by magnetic resonance imaging, magnetic resonance angiography, and dual-energy x-ray absorptiometry
E.H.M. Hartman, J.A. Pikkemaat, J.J. van Asten, J.W.M. Vehof, A. Heerschap, W.J.G. Oyen, P.H.M. Spauwen, J.A. Jansen
Tissue Engineering, Volume 10, 747-54 (2004)  

Transmission electron microscopy TEM specimen holder for simultaneous in situ heating and electrical resistance measurements
M.A. Verheijen, J.J.T.M. Donkers, J.F.P. Thomassen, J.J. van den Broek, R.A.F. van der Rijt, M.J.J. Dona, C.M. Smit,
Rev. Sci. Instrum. (2004) 75, 426

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Te Free, Sb based phase-change materials for high-speed rewritable optical recording
L. van Pieterson, M. van Schijndel, J. Rijpers, M. Kaiser
Applied Physics Letters, Volume 83, number 7 (2003)

Characterization of Polymer Solar Cells by TOF-SIMS depth profiling
C.W.T. Bulle-Lieuwma, W.J.H. van Gennip, J.K.J. van Duren, P. Jonkheijm, R.A.J. Janssen and J.W. Niemansverdriet
Appl. Surf. Science 203-204 (2003) 547

Vascular endothelial growth factor-A determines detectability of experimental melanoma brain metastasis in GD-DTPA-enhanced MRI
W. Leenders, B. Kusters, J. Pikkemaat, P. Wesseling, D. Ruiter, A. Heerschap, J. Barentsz, R.M. de Waal
Int. J. Cancer, 105 (2003), 437-43

Experimental Evidence for secondary excitation in X-ray Photoelectron Spectroscopy
M.F. Ebel, R. Svagara, R. Ashury, H. Ebel, P.C. Zalm and C. van der Marel
J. Electron Spectr. Rel. Phen., 131-132 (2003) 145

Reduction of Mercury loss in fluorescent lamps coated with metal-oxide films
V.D. Hildenbrand, C. Denissen, J.H.M. Snijders, A.H.C. Hendriks, C. van der Marel and Y. Tamminga
J. Electrochem. Soc. 150 (2003) 147

Controlled Mounting of Individual Multiwalled Carbon Nanotubes on Support Tips
Niels de Jonge, Yann Lamy and Monja Kaiser
NANO letters, Volume 3, number 12 (2003)

Relating the Morphology of Poly(p-Phenylene): Methanofullerene Blends to Solar Cell Performance
J. van Duren, X. Yang, J. Loos, C. Bulle-Lieuwma, A. Sieval, J. Hummelen and R. Janssen
Proc. of SPIE, vol. 5215, Organic Volatics IV, (Ed: Z.H. Kafifi), SPIE, Bellingham, in press

SIMS dept profiling
C.W.T. Bulle-Lieuwma
Applied Surface Science 203-204 (2003) 547-550

Structural characterisation of mesoporous organosilica films for ultralow-k dielectrics
Femke K. de Theije, A. Ruud Balkenende, Marcel A. Verheijen, Mikhail R. Baklanov, Konstantin P. Mogilnikov, Yukiko Furukawa
J. Phys. Chem. B., 107 (2003) 4280-4289.

Indiumphosphide nanotubes
Erik P.A.M. Bakkers, Marcel A. Verheijen
J. Am. Chem. Soc. 125, 3440-3441 (2003)

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Structural Analysis of Submicrometer LiCoO2 Films
P.J. Bouwman, B.A. Bouwkamp, H.J.M. Bouwmeester, P.H.L. Notten, H.J. Wondergem
Journal of The Electrochemical Society, 148 (4) A311-A317, 2002

Explanation for the leakage current in polycrystalline-silicon thin-film transisitors made by Ni-silicide mediated crystallization
P.J. van der Zaag, M.A. Verheijen, S.-Y. Yoon, N.D. Young
Appl. Phys. Lett. , 81 (2002) 3404.

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Depth-resolved analysis in multi-layered glass and metal materials using laser ablation inductively coupled plasma mass spectroscopy
P. Mason, A. Mank
J. Anal. Atom. Spectrom. 16 (2001) 1381-1388 )

Depth analysis by Laser-Ablation ICP-MS
P. Mason, A. Mank
Earth Science - Principles and Applications, Ed. P. Sylvester, MAC Publications, 2001 )

Measurement of partial conversions during the solution copolymerization of styrene and butyl acrylate using on-line Raman spectroscopy
M. van den Brink, J-F. Hansen, P. de Peinder, A. van Herk, A. German
Journal of Applied Polymer Science 79 (2001) 426-436 )

Sol Gel coatings for optical and dieletric applications
M. Bohmer, A. Balkenende, T. Bernards, M. Peeters, M. van Bommel, E. Boonekamp, M. Verheijen, L. Krings, Z. Vroon
Handbook of advanced electronic and photonic materials, Ed. H.S. Nalwa, (Academic Press, San Diego, USA, (2001), Volume 5, pp 220-262

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A study of the effect of the polymer network and the solvent on the ion conductivity in gels
R.A.M. Hikmet, M.P.J. Peeters
J. Elec. Chem. Soc. 146 (7) 2397-2403 (1999)

Anti-phase domains and magnetism in epitaxial magnetite layers
T. Hibma, F.C. Voogt, L. Niesen, P.A.A. van der Heijden, J.J.T.M. Donkers, P.J. van der Zaag, W.J.M. de Jonge
Journal of Applied Physics (Vol. 85, nr. 8, p5291-5293), April 15, 1999

Boride-enhanced diffusion in silicon: bulk and surface layers
N.E.B. Cowern, M.J.J. Theunissen, F. Roozeboom, J.G.M. van Berkum
Appl. Phys. Lett. 75, 181-183 (1999)

Boron Vapour Phase Doping of Silicon for Bipolar Device Applications
M.J.J. Theunissen, C.E. Timmering, J.G. van Berkum, Y.J. Mergler
Jap. J. Appl. Phys. 38, 5805-5814 (1999)

Charaterisation of silicon Oxynitride films by Grazing-Emission X-ray fluorescence spectrometry
M.L. Monaghan, T. Nigam, M. Houssa, S. de Gendt, H.P. Urbach, P.K. de Bokx
Thin Solid Films, 1999

Energetics of Self-Interstitial Clusters in Silicon
N.E.B. Cowern, G. Mannino, P.A. Stolk, F. Roozeboom, H.G.A. Huizing, J.G.M. van Berkum, F. Cristiano, A. Claverie
Phys. Rev. Lett. 82, 4460-4463 (1999)

Growth of a single-domain smectic phase in a thin liquid-crystalline polymer film
A.R. Schlatmann
Physical Review E, Vol. 60, no. 4 (1999)

In-situ X-ray diffraction of Li intercalation in sol-gel V2O5 films
A.R. Schlatmann, E.A. Meulenkamp, W. van Klinken
Solid State Ionic 126 (1999) 235-244

Inorganic Coatings in Fluorescent Lamps
C. v.d. Marel, J.H.M. Snijders, Y. Tamminga, C.V. Hildenbrand, C.J.M. Denissen, L.M. Geerdinck
NL-MS 20.517 (1999)

Lithium Depth Profiling in Thin Electrochromic WO3 films
L.H.M. Krings, Y. Tamminga, J. van Berkum, F. Labohm, A. van Veen, W.M. Arnoldbik
J. Vac. Sci. Technol. A 17, 198-205 (1999)

Ostwald ripening of {113} defect precursors and transient enhanced diffusion
G. Mannino, N.E.B. Cowern, P.A. Stolk, F. Roozeboom, H.G.A. Huizing, J.G.M. van Berkum, W.B. de Boer, F. Cristiano, A. Claverie, M. Jaraiz
Mat. Res. Soc. Symp. Proc. 568, 163-... (1999)

Physical properties and battery performance of novel two-phase ion-conducting gels
R.A.M. Hikmet, M.P.J. Peeters, W. Nijssen
Solid State Ionics 126 (1999) 25-39

Physically trapped oxygen in sputter-deposited MoO_3 films
T.J. Vink, R.G.F.A. Verbeek, H. Snijders, Y. Tamminga
NL-MS 20.309 - Publication in Applied Physics Letters

Selective versus non-selective growth of Si and SiGe
W.B. de Boer, D. Terpstra, J.G.M. van Berkum
Mat. Sci. Eng. B67, 46-52 (1999)

Sol Gel coatings for optical and dielectric applications
M.R. Bohmer, A.R. Balkenende, T.N.M. Bernards, M.P.J. Peeters, M.J. van Bommel, E.P. Boonekamp, M.A. Verheijen, L.H.M. Krings, Z.R.E.P. Vroon
Handbook of advanced electronic and photonic materials, 1999

TEM and IR relectance studies on phase transitions in thin VOx films
M.A. Verheijen, E.P. Boonekamp
Proceedings Microscopy & Microanalysis '99, Portland, Oregon, Vol. 5, Suppl. 2 (1999) 842

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A 27 Al MAS, MQMAS and off-resonance nutation NMR study of aluminium containing silica-based Sol-Gel materials
J. Peeters
J.Sol-Gel Sci. and Technol., 1998

Alternative approach for the direct determination of silicon and other trace elements in tungsten metal with inductively coupled plasma atomic emission spectrometry
A.P.M. de Win
Journal of Analytical Atomic Spectrometry, April 1998, Vol. 13 (315)

Determination of lateral distribution of H and YHx
C.W.T. Bulle-Lieuwma
Bulletin on Materials & Technology, no. 23, June 1998

Determination of residual stress
K.J.A. van den Aker
Bulletin on Materials & Technology, no. 23, June 1998

High-frequency permeability of soft-magnetic Fe-Hf-O films with high resistivity
J. Huijbregtse, F. Roozeboom, J. Sietsma, J. Donkers, T. Kuiper, E. van de Riet
Journal of Applied Physics, 83(3), p1569-74, 1 February 1998

Inductively coupled plasma - mass spectrometry
A.J.G. Mank
Bulletin on Materials & Technology, no. 23, June 1998

Ion beam etching for thin-film analysis
C. van der Marel
Bulletin on Materials & Technology, no. 23, June 1998

Irreversible lithium intercalation by excess oxygen in sputtered tungsten oxide films
T.J. Vink, E.P. Boonekamp, R.G.F.A. Verbeek, Y. Tamminga
Journal of Applied Physics 1998

Low-energy implantations of decaborane (B10H14) ion clusters in silicon wafers
A.G. Dirks, P.H.L. Bancken, J. Politiek, N.E.B. Cowern, J.H.M. Snijders, J.G.M. van Berkum, M.A. Verheijen
Proceedings IIT 1998, Kyoto, Japan

Low Energy (0.1-10 kev) 11B+ ion implantation damage characterisation using Rutherford Backscattering Spectrometry
E.J.H. Collart, M. Heijdra, K. Weemers, Y. Tamminga, J.G.M. van Berkum, M.A. Verheijen
Proceedings IIT 1998, Kyoto, Japan

Materials Analysis: an everlasting challenge
M.P.A. Viegers
Bulletin on Materials & Technology, no. 23, June 1998

Measurement of emitted compounds
A.H.C. Hendriks
Bulletin on Materials & Technology, no. 23, June 1998

Nanocrystalline structure of WO3 thin films prepared by the sol-gel technique
O. Pyper, R. Schöllhorn, J.J.T.M. Donkers, L.H.M. Krings
Materials Research Bulletin, Vol. 33, no. 7, pp1095-1101, July 1998

Quantification of surface modification
Y.J. Mergler
Bulletin on Materials & Technology, no. 23, June 1998

Quantitative analysis of oxidation states
P.J. Rommers
Bulletin on Materials & Technology, no. 23, June 1998

Soft-magnetic fluxguide materials
F. Roozeboom, P.J.H. Bloemen, W. Klaassens, E.G.J. van de Riet, J.J.T.M. Donkers
Philips Journal of Research, 51 (1), p59-91, March 1998

Sol-gel chemistry studied by solid-state NMR
M.J.P. Peeters
Bulletin on Materials & Technology, no. 23, June 1998

Structure and sensor properties of a robust GMR material system
K.-M.H. Lenssen, J.J.T.M. Donkers, A.E.T. Kuiper, J. van Driel
Proceedings of the MRS 1999 Spring Meeting, San Francisco, California, USA

The application of on-line thermal desorption - gas chromatography - Fourier-transform infrared spectroscopy - mass spectrometry for the characterisation of polymers
Paul Krüsemann, Jan Jansen
Journal of Chromatography A (Vol. 819, p243-248), 1998

Transmission electron microscopy study on Cu-Ni-SiO2 thin film electrical resistors
J.J.T.M. Donkers, J.J. van den Broek, R.A.F. van der Rijt
Proceedings of the E-MRS 1998 Spring Meeting (June 16-19, 1998), Strasbourg, France

X-ray fluorescence analysis
H.A. van Sprang
Bulletin on Materials & Technology, no. 23, June 1998

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A practical application of available aids for faithful depth distribution representation
S.L.G. Toussaint, P.C. Zalm
Proceedings ECASIA '97 (eds. I. Olefjord, L. Nyborg and D. Briggs, J. Wiley & Sons Ltd., New York, 1997) 73

An alternative approach for direct analysis of silicon and other trace elements in tungsten metal, with Inductively Coupled Plasma Atomic Emission Spectrometry
A. de Win
Journal Analytical Atomic Spectrometry, 1998

Band analysis of hydrated human skin stratum corneum ATR-FTIR spectra in vivo
G.W. Lucassen, G. van Veen, J. Jansen
Journal of Biomedical Optics 1997

Characterization of Low Energy (100 eV-10 keV) Boron Ion Implantation
E.J.H. Collart, K. Weemers, D.J. Gravesteijn, J.G.M. van Berkum
Proceedings Ultra-Shallow Junctions-97, April 6-9, 1997, Research Triangle Park, NC, USA

Determination of light elements by X-ray spectroscopy
Part I - Analytical implications of using scattered tubelines
Part II - Boron in glass

Hans A. van Sprang, Mirjan H.J. Bekkers
X-ray Spectrometry, 1997
Electrochemistry of rechargeable Li polymer battery systems by in-situ FT-IR microanalysis

J. Jansen, R. Hikmet
Proceedings ICOFTS-11, Athens, Georgia, USA, 1997
GexSi(1-x) far infrared detectors I: absorption in multiple quantum well and heterojunction internal structures

R. Strong, R. Misra, D.W. Greve, P.C. Zalm
J. Appl. Phys. 82 (1997) 5191
Limits to the deconvolution of SIMS depth profiles

P.C. Zalm
Proceedings SIMS X (eds. A. Benninghoven, J. Fehmer and H.W. Werner, J. Wiley & Sons Ltd., New York, 1997) 73
Low Energy Implantation and Transient Enhanced Diffusion

Physical Mechanisms and Technology Implications
N.E.B. Cowern, E.J.H. Collart, J. Politiek, P.H.L. Bancken, J.G.M. van Berkum, K.K. Larsen, P.A. Stolk, H.G.A. Huizing, P. Pichler, A. Burenkov, D.J. Gravesteijn
Proceedings of the Mater. Res. Soc. Spring Meeting, March 31-April 4, San Francisco CA, USA, 1997

Multilayer thin film analysis using FP-Multi software
Mirjan H.J. Bekkers, Hans A. van Sprang
X-ray Spectrometry, 26 (1997), 122

NO reduction by hydrogen over promoted Pt catalysts
Y.J. Mergler, B.E. Nieuwenhuys
Applied Catalysis 12 (1997) 95

Overlayer corrections in XPS
P.C. Zalm
Surf. & Interf. Anal. 26 (1998)

Rapid thermal annealing
J. Huijbregtse, F. Roozeboom, J. Sietsma, J.J.T.M. Donkers, E. v.d. Riet
J. Appl. Phys., January, 1997

Room-Temperature Migration of Implanted Boron in Silicon
E.J.H. Collart, K. Weemers, D.J. Gravesteijn, J.G.M. van Berkum, N.E.B. Cowern
Proceedings of the Mater. Res. Soc. Spring Meeting, March 31-April 4, San Francisco CA, USA, 1997

SIMS Depth Profiling of Ultra-Low Energy Ion Implants: Problems and Solutions
J.G.M. van Berkum, E.J.H. Collart, K. Weemers, D.J. Gravesteijn, K. Iltgen, A. Benninghoven, E. Niehuis
Proceedings Ultra-Shallow Junctions-97, April 6-9, 1997, Research Triangle Park, NC, USA

Soft-magnetic fluxguide materials
F. Roozeboom, P.J.H. Bloemen, W. Klaassens, E.G.J. v.d. Riet, J.J.T.M. Donkers
Nat.Lab.manuscript M.S. 19.195, 1997

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